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Avid Kamgar
Avid Kamgar
New Jersey Institute of Technology
Annealing (metallurgy)
Dielectric strength
Gate dielectric
Analytical chemistry
Oxide
1
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6
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Impact of gate-poly grain structure on the gate-oxide reliability [CMOS]
2002
IEEE Electron Device Letters
Avid Kamgar
H. Vaidya
F.H. Baumann
S. Nakahara
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Citations (6)
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