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Fengbin Tian
Fengbin Tian
Hebei University of Science and Technology
Optoelectronics
Trapping
Ferroelectricity
Materials science
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5
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4
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Impact of Interlayer and Ferroelectric Materials on Charge Trapping during Endurance Fatigue of FeFET with TiN/HfxZr1-xO2/interlayer/Si (MFIS) Gate Structure
2021
arXiv: Applied Physics
Fengbin Tian
Shujing Zhao
Hao Xu
Jinjuan Xiang
Tingting Li
Wenjuan Xiong
Jiahui Duan
Junshuai Chai
Kai Han
Xiaolei Wang
Wenwu Wang
Tianchun Ye
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Impact of Interlayer and Ferroelectric Materials on Charge Trapping During Endurance Fatigue of FeFET With TiN/HfₓZr₁₋ₓO₂/Interlayer/Si (MFIS) Gate Structure
2021
IEEE Transactions on Electron Devices
Fengbin Tian
Shujing Zhao
Hao Xu
Jinjuan Xiang
Tingting Li
Wenjuan Xiong
Jiahui Duan
Junshuai Chai
Kai Han
Xiaolei Wang
Wenwu Wang
Tianchun Ye
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Experimental Extraction and Simulation of Charge Trapping during Endurance of FeFET with TiN/HfZrO/SiO2/Si (MFIS) Gate Structure
2021
arXiv: Applied Physics
Shujing Zhao
Fengbin Tian
Hao Xu
Jinjuan Xiang
Tingting Li
Junshuai Chai
Jiahui Duan
Kai Han
Xiaolei Wang
Wenwu Wang
Tianchun Ye
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Citations (3)
The Distance of Lance and Angle Cosine for the Ultrasonic Guided Wave Signal Processing
2011
ITCEMS | International Conference of Information Technology, Computer Engineering and Management Sciences
Fengbin Tian
Yang Jiao
Guang-Hai Li
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The effect of defect depth on reflection coefficient of ultrasonic guided waves in steel pipes
2010
ICWAPR | International Conference on Wavelet Analysis and Pattern Recognition
Fengbin Tian
Yang Jiao
Guang-Hai Li
Guang-Kai Sun
Yu-Bo Zhao
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