Memory Technology, Design and Testing
{
"id": 2132097341,
"name": "Memory Technology, Design and Testing",
"year": 2007,
"location": "Taipei, Taiwan",
"start_date": "2007-12-03",
"end_date": "2007-12-05",
"url": "http://www.ieee-mtdt.org/",
"Abstract_Registration_Due": "2007-09-15",
"Submission_Deadline": "2007-10-15"
}
{
"total": 1,
"List": [
{
"conference_instance_id": 2132097341,
"name": "MTDT 2007",
"year": 2007,
"location": "Taipei, Taiwan",
"url": "http://www.ieee-mtdt.org/",
"paper_count": 24,
"hindex": 5,
"citation_count": 110,
"start_date": "2007-12-03",
"end_date": "2007-12-05",
"abstract_registration_date": "2007-09-15",
"submission_deadline_date": "2007-10-15",
"notification_due_date": null,
"final_version_due_date": null
}
]
}
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