Memory Technology, Design and Testing

{ "id": 2132097341, "name": "Memory Technology, Design and Testing", "year": 2007, "location": "Taipei, Taiwan", "start_date": "2007-12-03", "end_date": "2007-12-05", "url": "http://www.ieee-mtdt.org/", "Abstract_Registration_Due": "2007-09-15", "Submission_Deadline": "2007-10-15" }
{ "total": 1, "List": [ { "conference_instance_id": 2132097341, "name": "MTDT 2007", "year": 2007, "location": "Taipei, Taiwan", "url": "http://www.ieee-mtdt.org/", "paper_count": 24, "hindex": 5, "citation_count": 110, "start_date": "2007-12-03", "end_date": "2007-12-05", "abstract_registration_date": "2007-09-15", "submission_deadline_date": "2007-10-15", "notification_due_date": null, "final_version_due_date": null } ] }
2007-12-03
Taipei, Taiwan
  • 2007-09-15

    Abstract Registration Due

  • 2007-10-15

    Submission Deadline

  • 2007-12-03

    Conference Start Date

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  • 1
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