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Niゲートにおける侵食欠陥形成AlGaN/GaN高電子移動度トランジスタ【Powered by NICT】
Niゲートにおける侵食欠陥形成AlGaN/GaN高電子移動度トランジスタ【Powered by NICT】
2017
P. G. Whiting
M. R. Holzworth
Aaron G. Lind
S. J. Pearton
K. S. Jones
Lu Liu
Tsung-Sheng Kang
F. Ren
Y. Xin
Keywords:
Computer engineering
Electronic engineering
Engineering
Systems engineering
Reliability engineering
Correction
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