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Effective Fault Isolation Using Memory BIST and Logic BIST Diagnostic Techniques
Effective Fault Isolation Using Memory BIST and Logic BIST Diagnostic Techniques
2011
Rakesh Kinger
Chuck Tong
Ayyaz Chaudhry
Vijay Chowdhury
Wenzhen Sun
Hongqi Deng
Steve Smith
Keywords:
Fault detection and isolation
Embedded system
AND gate
Computer science
Correction
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