An imaging system for positioning a probe tip on a contact area of a microchip and a method for displaying
2001
Imaging system is ready for positioning a probe tip (6) when placed on a contact area (7) a microchip (2), and for displaying a measured there signal, comprising an imaging plane (3), in which the contact region (7) increases, characterized in that that a gating device is provided which is adapted to provide the representation of the measurement on the tip (6) with a measuring device (10) the measured signal in the image plane (3).
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