Measuring M2 values for On-Wafer Vertical Cavity Surface Emitting Lasers

William North,David Chacko,Peter Zeidler,Janice Blane,Kirk A. Ingold,Brian Souhan,James J. Raftery

Measuring M2 values for On-Wafer Vertical Cavity Surface Emitting Lasers

2015

William North
David Chacko
Peter Zeidler
Janice Blane
Kirk A. Ingold
Brian Souhan
James J. Raftery

We report on M2 measurements taken for on-wafer vertical cavity surface emitting lasers (VCSELs). We measured M2 for oxide-confined VCSELs and photonic crystal (PhC) VCSELs of similar lasing aperture sizes.

Keywords:

Laser
Wafer
Aperture
Optoelectronics
Optics
Photonic crystal
Lasing threshold
Materials science

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