On-chip power source noise peak value measurement system suitable for integrated circuit chip and measurement method of measurement system

The invention discloses an on-chip power source noise peak value measurement system suitable for an integrated circuit chip and a measurement method. According to the power source noise peak value measurement system, digital signatures can be generated through resistor voltage division, inverter amplification and trigger sampling, so that power source noise peak values at various regions on a power source network on the integrated circuit chip can be measured in real time; and an adaptive control module is used in cooperation, so that adjustment processing can be performed on the measured peak values, and therefore, influence of power source noises on the performance of the integrated circuit chip can be decreased. The power source noise peak value measurement system of the invention has the advantages of high measuring accuracy and little influence on the chip. The power source noise peak value measurement system can be independently used for monitoring or testing the chip so as to reduce the interference of the power source noises to the chip.