Old Web
English
Sign In
Acemap
>
Paper
>
K Repair and RC Improvement in 28nm Logic Devices and Beyond
K Repair and RC Improvement in 28nm Logic Devices and Beyond
2014
Ming Zhou
Qinglin Chai
Yingjie Chen
Xianyuan Li
Hao Deng
Zongtao Wang
Ganming Zhao
Beichao Zhang
Keywords:
Reliability engineering
Computer science
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]