Characterization of spectral diffusion by slow-light photon-correlation spectroscopy

Solid-state quantum emitters are playing a crucial role in the development of photonic quantum technologies. However, several decoherence mechanisms are known to impact the device performances and scalability. In various quantum emitter materials the fluctuation of the two-level system has been investigated by different methods to capture the evolution of coherence reduction. However, resolving the dynamics of spectral diffusion in the fundamental framework of on-demand single-photon generation remained unsolved. Hereby, the challenge is to observe with high time and energy resolution the impact of fluctuations directly in the properties of the emitted photons. In this Rapid Communication, we demonstrate the use of dispersion in a slow-light medium to map the photons frequency domain into time domain, observed as frequency-dependent time-of-flight. This allows for the measurement of the emission spectrum and the quantification of the spectral diffusion dynamics in one intensity correlation measurement. On exemplary semiconductor quantum dots, the impact of charge and spin noise on the spectral diffusion are revealed to follow an Ornstein-Uhlenbeck process. By a single measurement, broadening from the excitation repetition up to the stationary limit is resolved. This enables one to extract time-dependent two-photon interference visibilities for various timescales, which is a key performance measure for quantum emitters.