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Characterization of dielectric function for metallic thin films based on ellipsometric parameters and reflectivity
Characterization of dielectric function for metallic thin films based on ellipsometric parameters and reflectivity
2019
Liu Jiamin
Lin Jianbin
Hao Jiang
Honggang Gu
Xiuguo Chen
Chuanwei Zhang
Guanglan Liao
Shiyuan Liu
Keywords:
Reflectivity
dielectric function
Optoelectronics
metallic thin films
Materials science
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