Producing and identifying multiply charged fullerene ion beams and their compounds

Endohedral Fullerene is expected to be utilized for such application as quantum computing or magnetic resonance imaging contrast agent, because it has various material characteristics. It is confirmed that multiply charged fullerene ion beams have been produced on the electron cyclotron resonance ion source (ECRIS) at Osaka Univ. However, it is difficult to identify multiply charged fullerene ions because their spectrums overlap single charged dissociated-fullerene ions. Therefore, production of multiply charged fullerene ions can be confirmed by identifying non-overlapped fullerene ions spectrums. The aim of this paper is to product and identify multiply charged fullerene ions in the ECRIS. As a result, multiply charged fullerene ions have been clearly isolated from dissociated ones and then identified them. Furthermore, we report the result of identifying nitrogen-fullerene compounds produced in the ECRIS.