Electron back scatter diffraction and synchrotron X-ray peak profile analysis as tools for microstructural characterization of large strain work hardened metals

By the example of large strain cold worked Al, two new methods (electron back scatter diffraction and synchrotron X-ray peak profile analysis) are introduced which are well capable to monitor the characteristics of the deformation structure on a microstructural level. While the first method has been proved to properly describe the sizes of newly forming subgrains and their misorientations, the second one allows for measuring the local densities of dislocations, their arrangements and the local long range internal stresses. The results show that during large strain cold working new high angle grain boundaries are formed which exhibit markedly higher local dislocation densities and a much lower level of local internal stresses compared with those of the original dislocation cell walls from which they appear to develop.