Markov model for k-out-of-n :G systems with built-in-test

Abstract This paper considers some new variations when the Built-In-Test technique is applied to k -out-of- n :G systems. A complete Markov model for the reliability and availability analysis of k -out-of- n :G systems with BIT is developed. Both fault coverage and false alarm are considered. A new inverse Laplace transform formula is derived to solve the differential simultaneous equations. Finally, generalized analytical functions for system reliability and availability are obtained. Our approach and solution are helpful and applicable for analyzing the impact of BIT design parameters on k -out-of- n :G system RAM and optimizing the redundancy management strategy.