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Scanning Probe Microscopy of Topological Structure Induced Electronic States of Graphene
Scanning Probe Microscopy of Topological Structure Induced Electronic States of Graphene
2020
Shichao Li
Mengxi Liu
Xiaohui Qiu
Keywords:
Scanning probe microscopy
Optoelectronics
electronic states
Atomic force microscopy
Graphene
Scanning tunneling microscope
Materials science
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