CONSIDERATION OF TWO DIMENSIONAL SURFACE ROUGHNESSES IN QUANTITATIVE XPS ANALYSIS
1987
The effect of two dimensional surface roughnesses on the intensities of XPS peaks have
been investigated. The following models have been studied: square base pits with side walls
perpendicular to the surface in chequered position, square base pyramid shaped pits touching
each other by their edges, square base pyramids touching each other by their bottom edges, and
spheres in closest packing with a planar tangent surface. On the latter model also the effect of ion
etching has been studied. The application of the results are demonstrated on two quantitative
surface analytical problems.
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