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Metal Migration Induced Breakdown from Gate Contact in Bulk FinFET Devices
Metal Migration Induced Breakdown from Gate Contact in Bulk FinFET Devices
2021
Xin Yang
Yihong Qing
Kuei-Shu Chang-Liao
Yuchong Qiao
Chaolun Wang
Zhiwei Liu
Luoyong Li
Chihang Tsai
Yongren Wu
Yazhen Xie
Weisong Yu
Xing Wu
Keywords:
Optoelectronics
Metal
Materials science
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