A SET Study on SRAM Memory
2019
We report a MBU-like transient test result on 4Mb SRAM die during HI SEE test. Further SEE laser test study showed that the root cause is the floating pads to conFigure & probe the die creating transient SEFI. A mitigation was also proposed and verified in the following laser and HI tests..
Keywords:
- Correction
- Source
- Cite
- Save
- Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI