Computer Color Mapping of Configuration of Goss Grains after an Intermediate Annealing in Grain Oriented Silicon Steel

In order to elucidate the formation of Goss grains after an intermediate annealing in grain oriented silicon steel, computer color mapping was performed by processing the orientation information of Kossel diffraction patterns taken from the recrystallized grains in advance.The Goss grains forming colonies in the vicinity of steel surface after an intermediate annealing occupy an extremely large area inside the defined {hk0} matrix bands. The size of each Goss grain in this region is comparable to or slightly larger than that of other matrix grains. The perfection o f the [001] alignment o f the colonized Goss grains is much better than that of (110) plane and the colonized Goss grains are formed with the small boundary width of within 10° in the crystallographic plane. It is considered that the formation areas of Goss grains inherited by the structure memory from the original hot rolled texture take place with the strong perfection of the [001] alignment inside the defined {hk0} matrix bands.