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Comparison of charge pumping and 1/ƒ noise in irradiated Ge pMOSFETs
Comparison of charge pumping and 1/ƒ noise in irradiated Ge pMOSFETs
2011
Francis
Zhang
Fleetwood
Schrimpf
Galloway
Simoen
Mitard
Claeys
Keywords:
Logic gate
Hafnium compounds
Absorbed dose
Materials science
Noise (radio)
annealing
Irradiation
Optoelectronics
charge pumping
Correction
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