Contribution totheRFBreakdown inMicrowave Devices anditsPrediction

Inthis paper, theRFBreakdown powerthresholdTheconsequences ofamicrowave discharge ina com- inarbitrary complex components basedon rectangular ponentareextremely harmful. Thetransmitted power waveguide technology isinvestigated. Inparticular, mul- decreases, whichcanleadtothedestruction ofthepower tipactor (invacuum)andcoronadischarge (close tothe Paschen curveminimum) areanalyzed. Theobjective has source. Duetothshlgher reflection, thetemperature also beentopredict theRF Breakdown threshold forspace rises whichfinally results inthecomplete destruction of applications. Thesimulation results havebeenvalidated with thedevice. Theprevention ofbreakdown relies onthe manyexperimental tests also performed within theframeof careful testing ofthesubsystems during thesatellite test this work.Thegoodagreement achieved showsthevaliditycampaign. Infact, theoperating powerofthedevice must oftheapproach followed. of~~ ~ th