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Acemap > Paper > Single-Event Gate Rupture and Single-Event Burnout Test Results Performed on Hi-Rel Fuji Power MOSFETs: 2SK4217, 2SK4152, 2SK4155, and 2SK4158

Single-Event Gate Rupture and Single-Event Burnout Test Results Performed on Hi-Rel Fuji Power MOSFETs: 2SK4217, 2SK4152, 2SK4155, and 2SK4158

2009 
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