Broadband X-ray full field microscopy at a superbend

Over the last decade, synchrotron-radiation based X-ray Tomographic Microscopy (SRXTM) has established itself as a fundamental tool for non-invasive, quantitative investigations of a broad variety of samples, with application ranging from space research and materials science to biology and medicine. The beamline for TOmographic Microscopy and Coherent rAdiology experimenTs (TOMCAT) has been recently equipped with a full field, hard X-ray microscope with a theoretical pixel size down to 30 nm and a field of view of 50 microns. The nanoscope performs well at X-ray energies between 8 and 12 keV: here we illustrate the experimental setup and the performance of the instrument in both microscopy and tomography mode.