Micro-Raman mapping of VO2 (T) microcrystals orientation

Abstract Microcrystals orientation distribution in triclinic vanadium dioxide VO2 (T) films was investigated by polarized Raman scattering with a resolution of few μm and confirmed by electron backscatter diffraction. Euler angles used to describe the orientation of the crystal were determined by two different techniques and good agreement between the values was achieved. Finally, it was demonstrated that Raman scattering could be used to identify the direction of the lattice vector c for (002) crystals in consequence of the triclinic nature of VO2 (T).