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Failure Analysis on Diode-triggered Silicon-Controlled Rectifiers By using Nondestructive X-ray Microscopy
Failure Analysis on Diode-triggered Silicon-Controlled Rectifiers By using Nondestructive X-ray Microscopy
2021
Xinqian Chen
Mengge Jin
Feihou
Fang Liang
Zijian Zhang
Yanan Wang
Dongming Liu
Le Chen
Chaolun Wang
Zhiwei Liu
Xing Wu
Keywords:
Optoelectronics
Materials science
Silicon
X-ray
Diode
Microscopy
Correction
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