System-Level Radiation Hardening

—Cost/consequence of failure † CL—Confidence Level † CMOS—Complementary Metal-Oxide-Semiconductor † COTS—Commercial Off The Shelf † DDD—Displacement Damage Dose † DDR—Double-Data Rate † DSEE—Destructive SEE † EDAC—Error Detection and Correction † ELDRS—Enhanced Low Dose Rate Sensitivity † EOL—End of Life † F—Fluence † FPGA—Field Programmable Gate Array † GCR—Galactic Cosmic Rays † LET—Linear Energy Transfer † LRO—Lunar Reconnaissance Orbiter † MBU—Multi-Bit Upset † MCU—Multi-Cell Upset † MOSFET—Metal-Oxide-Semiconductor Field Effect Transistor † N—Number of events† P