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High Pressure X-Ray Diffraction Study of URu 2 Si 2
High Pressure X-Ray Diffraction Study of URu 2 Si 2
2003
K Kuwahara
Hajime Sagayama
Kazuaki Iwasa
M. Kohgi
S. Miyazaki
J. Nozaki
J. Nogami
Makoto Yokoyama
Hiroshi Amitsuka
Hironori Nakao
Y Murakami
Keywords:
X-ray crystallography
Analytical chemistry
high pressure
Materials science
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