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Reflectometry diagnostics at Wendelstein 7-X: Systems overview and initial results
Reflectometry diagnostics at Wendelstein 7-X: Systems overview and initial results
2018
T. Windisch
D. Carralero
T. Estrada
O. Grulke
M. Hirsch
W. Kasparek
A. Krämer-Flecken
J. W. Oosterbeek
Luis F. Pacios
A. de la Peña
B. Plaum
G. Weir
S. Wolf
T. Klinger
Keywords:
Reflectometry
Wendelstein 7-X
Analytical chemistry
Materials science
Optics
Correction
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