Measurement of spatial resolution of a double-sided AC-coupled microstrip detector

Abstract Capacitively coupled Si strip detectors with readout on both the p-side and the n-side have been developed. A novel scheme to separate strips ohmically on the n-side by means of field depletion via a suitable potential applied to the readout strips has been successfully demonstrated. Results on the spatial resolution of these detectors for both sides measured in a high energy beam are presented. The spatial resolution of the n-side has been measured at different incident angles of the beam tracks with respect to a vertical plane through the n + strips at 0°, 20° and 40°.