Near-Threshold L1 Data Cache for Yield Management under Process Variations

Near-threshold computing (NTC) has recently emerged and been considered as a strong candidate for future energy-efficient computing. However, adverse impacts from process variation such as delay and power fluctuations within die as well as across dies are much more severe than the super-threshold regime. In particular, static random access memory (SRAM)-based components (e.g., cache memories) are easily affected by process variation in NTC, resulting in large delay fluctuations. It incurs a huge loss in the maximum clock frequencies of processors, which eventually leads to huge yield losses. In this paper, we first analyze L1 data cache yield in NTC and reveal an inefficiency of frequency binning for yield improvement in NTC. We then introduce a variable latency L1 data cache for NTC to obtain a sufficient yield. By allowing the higher cache access cycles, we can improve cache yield with only a little performance overhead. Moreover, we propose an adaptive line migration technique which improves performance and energy efficiency of variable latency caches. The cache line which is expected to be frequently accessed in the near future is dynamically migrated to the fastest way in a cache set. According to our evaluation, our cache architecture greatly improves cache yield with only a little performance, energy, and area overhead.