Structural characterization of CdS thin film on quartz formed by femtosecond pulsed laser deposition at high temperature

CdS thin films have been grown on quartz substrates using femtosecond pulsed laser deposition. The structural and optical properties of the CdS thin films were characterized by X-ray diffraction, scanning electron microscopy, atomic force microscopy, X-ray photoelectron spectroscopy and Raman spectroscopy. The results indicate that the compositional segregation of the CdS films could be drawn from the selective evaporation of sulfur from the film surface as a result of heating up the substrates. Growth temperature played an important role on changing crystal structure and optical properties of the CdS films.