The Development of a Non-Destructive Analysis System with Negative Muon Beam for Industrial Devices at J-PARC MUSE

Motonobu Tampo1, Kouji Hamada1, Naritoshi Kawamura1, Makoto Inagaki2, Takashi U. Ito3, Kenji M. Kojima1, Kenya M. Kubo4, Kazuhiko Ninomiya2, Patrick Strasser1, Go Yoshida2 and Yasuhiro Miyake1 1Institute of Materials Structure Science, KEK, Tokai, Ibaraki 319-1195, Japan 2Department of Chemistry, Graduate School of Science, Osaka University, 1-1 Machikaneyama Toyonaka, Osaka, 560-0043 Japan 3Advanced Science Research Center, Japan Atomic Energy Agency, Tokai, Naka, Ibaraki, 319-1195, Japan 4International Christian University, Mitaka, Tokyo, 181-8585, Japan