Radiation Performance of a Flash NOR Device

We present the results of single-event effects (SEE) and total ionizing-dose (TID) testing performed on the die used in DDC's 56F64008 flash-NOR devices. The device was single event latchup (SEL) immune at LET=85 MeV cm 2 /mg. All single event functional interrupts (SEFI) observed could be cleared by resetting the part without a need for power cycling.