An experimental investigation of the microstrip step discontinuity

A simple, inexpensive technique for performing wideband (multidecade) validation measurements is introduced. The authors emphasize scaling the desired validation frequencies and dimensions so that both the measurement and the fabrication can be performed accurately and inexpensively. The utility of a composite structure (rather than a single discontinuity) is also demonstrated, and the sensitivity of the structure to changes in the discontinuity is checked. The technique allows an inexpensive validation to be performed which previously could be realized only with large scatter, if at all. >