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Invited) Reliability of SiGe Channel MOS
Invited) Reliability of SiGe Channel MOS
2013
Jacopo Franco
Ben Kaczer
Jerome Mitard
M. Toledano-Luque
Geert Eneman
Philippe Roussel
Moonju Cho
Thomas Kauerauf
Liesbeth Witters
Andriy Hikavyy
Geert Hellings
Lars-Ake Ragnarsson
Naoto Horiguchi
Tibor Grasser
Marc Heyns
Guido Groeseneken
Keywords:
Electronic engineering
Communication channel
Materials science
Optoelectronics
Correction
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