Observation of Defects of CuInSe 2 by 300 kV Aberration Corrected Scanning Transmission Electron Microscope
2011
Keywords:
- Analytical chemistry
- Scanning confocal electron microscopy
- Conventional transmission electron microscope
- Scanning transmission electron microscopy
- Environmental scanning electron microscope
- Low-voltage electron microscope
- Microscope
- Electron beam-induced deposition
- Materials science
- Electron microscope
- Optics
- Correction
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