Development and application of a macro model for flash EEPROM design

The inclusion of embedded flash memory in systems-on-chip designs enables the addition of many new features. However to enable designers to embed flash memory in an efficient and competent manner, they must have the capability to simulate full circuit operation. Therefore a flexible flash EEPROM model is required. An accurate and numerically efficient model for the transient and DC characteristics of Fowler Nordheim (FN) based Flash EEPROM cells has been developed. The model has been extensively validated, using read, program and erase operations. The model has also been applied to several applications, in a typical structure. These display the ability of the model to accelerate the design cycle for applications which require flash memory.