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Harnessing the base-pushout effect for ESD protection in bipolar and BiCMOS technologies
Harnessing the base-pushout effect for ESD protection in bipolar and BiCMOS technologies
2002
Streibl
Esmark
Sieck
Stadler
Wendel
Szatkowski
Gossner
Keywords:
Electrostatic discharge
Pushout
BiCMOS
Electrical engineering
Base (topology)
Computer science
Correction
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