Old Web
English
Sign In
Acemap
>
Paper
>
Quality assessment of ultra-thin CMOS sensors for the Micro Vertex Detector of the CBM experiment at FAIR
Quality assessment of ultra-thin CMOS sensors for the Micro Vertex Detector of the CBM experiment at FAIR
2014
M. Koziel
B. Milanovic
N. Bialas
J. Stroth
M. Deveaux
Keywords:
Vertex (geometry)
Electronic engineering
Database
Detector
CMOS
Engineering
Data mining
vertex detector
quality assessment
Computer hardware
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]