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Conductive Nanotube-based Scanning Probe Microscopy Applications
Conductive Nanotube-based Scanning Probe Microscopy Applications
2010
Paul McClure
Vladimir Mancevski
Joseph J. Kopanski
Ilona Sitnitsky
V. P. LaBella
Kathleen Dunn
Matthew D. Bresin
Phillip D. Rack
Victor Vartanian
Keywords:
Conductive atomic force microscopy
Scanning probe microscopy
Scanning ion-conductance microscopy
Scanning capacitance microscopy
Analytical chemistry
Nanotube
Scanning gate microscopy
Materials science
Electrical conductor
Optoelectronics
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