An Effencient ESM Technique for Three-Dimension Radiation Source Localization

This paper proposes a spatial scanning method based on emission source microscopy (ESM), which extends the scanning point distribution from two-dimension (2D) plane to three-dimension (3D) volume space. A commonly used method is the planar scanning, which can determine the radiation source in the industrial field, but the increasing number of electronic devices, uneven shapes and other reasons make plane scanning difficult or require a higher price. Based on the characteristics of linear operation of ESM algorithm and Fourier transform, the three-dimensional scanning method obtained can better solve the shortcomings of planar 2D scanning. The simulation results show that under the same sampling point, the electric field data collected in three planes can also accurately locate the position of the radiation source.