Reliability assessment of MEMS switches for space applications: laboratory and launch testing

A novel combination of ground-based and flight tests was employed to examine the reliability of capacitive radio-frequency microelectromechanical switches for use in space applications. Laboratory tests were initially conducted to examine the thermomechanical effects of packaging and space-like thermal stresses on the pull-in voltage of the devices; during this process it was observed that operational stability is highly dependent on the geometrical design of the switch and this must be taken in to account during the design stage. To further expose the switches to acceleration levels experienced during a space mission, they were launched on board a sounding rocket and then subjected to free-fall from a height of over 1.3 km with a resulting impact of over 3500g. Post launch analysis indicates that the switches are remarkably resilient to high levels of acceleration. Some evidence is also present to indicate that time-dependent strain relaxation in die attach epoxy materials may contribute to minor variations in device shape and performance.