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Comprehensive Analysis of Low-frequency Noise Variability Components in Bulk and FDSOI (SOTB) MOSFETs
Comprehensive Analysis of Low-frequency Noise Variability Components in Bulk and FDSOI (SOTB) MOSFETs
2017
Keiichi Maekawa
Hideki Makiyama
Yoshiki Yamamoto
Takumi Hasegawa
Shinobu Okanishi
Kenichiro Sonoda
Hiroki Shinkawata
Tomohiro Yamashita
Shiro Kamohara
Y Yamaguchi
Keywords:
Infrasound
Optoelectronics
Materials science
Correction
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