Atomic Resolution Imaging of TiO 2 Surface by Frequency Modulation Atomic Force Microscopy
2016
Keywords:
- Atomic force acoustic microscopy
- Atomic de Broglie microscope
- Non-contact atomic force microscopy
- Conductive atomic force microscopy
- Scanning capacitance microscopy
- Frequency modulation
- Photoconductive atomic force microscopy
- Kelvin probe force microscope
- Analytical chemistry
- Chemistry
- Optoelectronics
- Materials science
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