Old Web
English
Sign In
Acemap
>
Paper
>
Efficient reuse of domain-specific test knowledge: An industrial case in the smart card domain
Efficient reuse of domain-specific test knowledge: An industrial case in the smart card domain
2012
Devos
Ponsard
Deprez
Bauvin
Moriau
Anckaerts
Keywords:
Reuse
Smart card
Embedded system
specific test
test
Domain (software engineering)
Computer science
Correction
Source
Cite
Save
Machine Reading By IdeaReader
3
References
2
Citations
NaN
KQI
[]