Variations in Structural and Electrical Properties of Ba-Hexaferrite due to Pb Substitution

BaFe2-xPbxO9 (x=0.0 to 1.0) samples were prepared by co-precipitation method. All samples were sintered at 960±5°C for three hours. Structural properties were investigated by X-ray diffraction (XRD) and Scanning electron microscopy (SEM). Variation in structural parameters was calculated from XRD obtained data. SEM micrographs were used to study the morphology and grain growth. No regular increase or decrease in structural parameters and morphology is observed with increase in Pb content. For dc electrical characterizations, dc resistivity was measured as a function of temperature up to 750K. Data obtained was further analyzed and different dc parameters like activation energy and mobility were measured. For dielectric analysis, capacitance C was measured in the frequency range from 100 kHz to 3MHz. High dielectric constant for this material makes this material suitable for applications like multilayer capacitors (MLC), microwave devices and dynamic random access memory (DRAM).