Surface Contamination: A Natural Way toward High-Resolution Electric Force Microscopy in Contact-Resonant Mode
2020
Electric force microscopy (EFM)-based methods have the capacity to probe surface potential, dielectric properties, and surface charges. It can be robustly used for analyzing charge-transfer mechani...
Keywords:
- Correction
- Source
- Cite
- Save
- Machine Reading By IdeaReader
40
References
0
Citations
NaN
KQI