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A new form measurement system based on subaperture stitching with a line-scanning interferometer
A new form measurement system based on subaperture stitching with a line-scanning interferometer
2016
Sören Laubach
Gerd Ehret
Jörg Riebeling
Peter Lehmann
Keywords:
System of measurement
Metrology
Remote sensing
Image stitching
Optics
Interferometry
Computer science
line scanning
Materials science
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