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Low NiGe Contact Resistances by Carrier Activation Enhancement (CAE) Techniques for Ge CMOSFETs
Low NiGe Contact Resistances by Carrier Activation Enhancement (CAE) Techniques for Ge CMOSFETs
2013
Hidenori Miyoshi
Tetsuji Ueno
Yoshihiro Hirota
Junji Yamanaka
Keisuke Arimoto
Kiyokazu Nakagawa
Takanobu Kaitsuka
Keywords:
Optoelectronics
Materials science
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