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High-Q microresonator characterization by optical frequency domain reflectometry
High-Q microresonator characterization by optical frequency domain reflectometry
2020
Xiaopei Zhang
Ze Chen
Xiaojie Yin
Xiaoping Liu
Haibin Lv
Yongqiang Wen
Xiaolei Zhang
Keywords:
Optoelectronics
optical frequencies
Materials science
Reflectometry
Correction
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